Ultra-P8WE5000 Microprocessor Development System for NXP P8WE50xx, P8WE60xx and MIFARE®PRO Smart Card Microcontrollers

for PKSC-P8WE5000 datasheet

Ashling's Ultra-P8WE5000 Microprocessor Development System provides Software Development, In-Circuit Emulation, Source-level Debugging, Program Performance Analysis and Code Coverage measurement in one powerful integrated system, hosted under Windows™. The NXP P8WE50xx, P8WE60xx and MIFARE®PRO Smart Card Microcontrollers are fully supported in ROM and EEPROM modes. Comprehensive support is provided for the devices' on-chip cryptographic calculation unit, ISO7816 Smart Card interface and Contactless interfaces.

System Specification

PathFinder Source Debugger
PathFinder provides the user-interface for the Ultra-P8WE5000 Development System. Controlled by button-bar, menus, mouse or automated script files, PathFinder provides System Mode or User Mode views in all Memory and Stack Windows. Full support for Keil and Raisonance C Compilers and Assemblers.

Code Coverage Measurement
Ashling’s “CodeScan” Code Coverage Measurement option for the Ultra Smart Card Development System identifies all tested, untested and unreachable code in a Smart Card program. This allows you to implement a repeatable, step-by-step program test procedure, to ensure that every byte of code has been tested, and to keep a formal record of test completeness

STARS Performance Analyser
Ashling’s STARS (Software Test, Analysis and Reporting System) Performance Analyzer option for the Ultra-P8WE5000 measures the maximum, minimum and total execution time of every function in the program code, in real-time. You can measure and optimize the execution time of your Smart Card program, identify untested program paths, and verify conformance to an execution-time specification.

Ashling support for all phases of NXP Smart Card Development

• Assembly and compilation of source code.
• Develop, execute, test and debug using the emulator.
• Test and debug the program and the application, using emulator and ISO7816 probe.
• Test Smart Card system application using emulator, probe and card reader.
• Test, performance-analyze, verify and validate the program with Ultra-P8WE5000 STARS and CodeScan options.
• Application-test the ROM code using the prototyping kit (PKSC-P8WE5000).

Secure Development Environment
Ashling’s range of development tools provides a comprehensive and powerful environment for all stages of development for NXP’ Smart Cards and Contact/Contactless (dual-Interface) cards. Working in co-operation with NXP, Ashling’s products and procedures ensure the security and reliability of Smart Card programs.

Emulation Specification

Emulation Memory
All on-chip RAM and EEPROM memories fully supported. 1MB Emulator Code memory giving full support for Ultra-P8WE5000 banked program development, including banked memory, banked code breakpoints, banked triggers, banked Code Coverage and banked execution trace. Auto-configuration of Ultra-P8WE5000 banked memory.

Clock
Smart Card external frequencies 1MHz to 8MHz, plus all internal clock sources, are fully supported.

Triggering

• 6 multiple trigger event recognisers.
• Up to 10 addresses and/or data ranges per event.
• Symbolic, binary, hex or function entry.
• Boolean combinations of events for start/stop triggers.
• Pre/post/centre triggering.

Trace Display

• 32K frames by 136 bits (expandable to 512k frames).
• 40-bit time-stamp on all frames.
• Display trace in C source, assembly or cycle-by-cycle.
• Card I/O pins are traced. 8-bit external trace port

Breakpoints

• Break-before-execute breakpoints (no "skid").
• 1MB instruction execution breakpoints.
• Break on frames after stop trigger.
• Break on trace buffer full.
• Execution timer, external break input.

Single-stepping

Single Step, Multiple Instruction Step, Step over Functions, Step into Functions, Step over Library-functions only, Return out of Functions at full speed

On-the-Fly Debugging
Full On-the-Fly, non-intrusive debugging: Set breakpoints, define triggers, view trace contents while your program is executing.

Variables
Full expression handling for assembler and C Variable monitoring, including complex arrays and structures

Host
PC with Windows™ and standard RS232 Serial Port at 115Kbits/s.

Power Supply
Universal Power Supply, 100-240V, 50/60 Hz a.c.

Emulation Probe Adapters

Format	Part Number	Description
ISO7816 (ID-1)	IN-CLA7816	Optional Probe Adapter for ISO7816 Smart Card contacts (ID-1 size). Emulates physical size and connections of ISO7816 Smart Card. Also contains a ZIF (Zero Insertion Force) SOIC28 socket, for testing of packaged engineering-samples of P8WE5000 ROM.