Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
Ashling Microsystems
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Ultra-P8WE5000 Microprocessor Development System for NXP P8WE50xx, P8WE60xx and MIFARE® PRO Smart Card Microcontrollers

for PKSC-P8WE5000 datasheet

Ashling's Ultra-P8WE5000 Microprocessor Development System provides Software Development, In-Circuit Emulation, Source-level Debugging, Program Performance Analysis and Code Coverage measurement in one powerful integrated system, hosted under WindowsTM. The NXP P8WE50xx, P8WE60xx and MIFARETMPRO Smart Card Microcontrollers are fully supported in ROM and EEPROM modes. Comprehensive support is provided for the devices' on-chip cryptographic calculation unit, ISO7816 Smart Card interface and Contactless interfaces.

System Specification

PathFinder Source Debugger
PathFinder provides the user-interface for the Ultra-P8WE5000 Development System. Controlled by button-bar, menus, mouse or automated script files, PathFinder provides System Mode or User Mode views in all Memory and Stack Windows. Full support for Keil and Raisonance C Compilers and Assemblers.

Code Coverage Measurement
Ashling's "CodeScan" Code Coverage Measurement option for the Ultra Smart Card Development System identifies all tested, untested and unreachable code in a Smart Card program. This allows you to implement a repeatable, step-by-step program test procedure, to ensure that every byte of code has been tested, and to keep a formal record of test completeness

STARS Performance Analyser
Ashling's STARS (Software Test, Analysis and Reporting System) Performance Analyzer option for the Ultra-P8WE5000 measures the maximum, minimum and total execution time of every function in the program code, in real-time. You can measure and optimize the execution time of your Smart Card program, identify untested program paths, and verify conformance to an execution-time specification.

Ashling support for all phases of NXP Smart Card Development

  • Assembly and compilation of source code.
  • Develop, execute, test and debug using the emulator.
  • Test and debug the program and the application, using emulator and ISO7816 probe.
  • Test Smart Card system application using emulator, probe and card reader.
  • Test, performance-analyze, verify and validate the program with Ultra-P8WE5000 STARS and CodeScan options.
  • Application-test the ROM code using the prototyping kit (PKSC-P8WE5000).

Secure Development Environment
Ashling's range of development tools provides a comprehensive and powerful environment for all stages of development for NXPTM Smart Cards and Contact/Contactless (dual-Interface) cards. Working in co-operation with NXP, Ashling's products and procedures ensure the security and reliability of Smart Card programs.

Emulation Specification

Emulation Memory
All on-chip RAM and EEPROM memories fully supported. 1MB Emulator Code memory giving full support for Ultra-P8WE5000 banked program development, including banked memory, banked code breakpoints, banked triggers, banked Code Coverage and banked execution trace. Auto-configuration of Ultra-P8WE5000 banked memory.

Clock
Smart Card external frequencies 1MHz to 8MHz, plus all internal clock sources, are fully supported.

Triggering

  • 6 multiple trigger event recognisers.
  • Up to 10 addresses and/or data ranges per event.
  • Symbolic, binary, hex or function entry.
  • Boolean combinations of events for start/stop triggers.
  • Pre/post/centre triggering.

Trace Display

  • 32K frames by 136 bits (expandable to 512k frames).
  • 40-bit time-stamp on all frames.
  • Display trace in C source, assembly or cycle-by-cycle.
  • Card I/O pins are traced. 8-bit external trace port

Breakpoints

  • Break-before-execute breakpoints (no "skid").
  • 1MB instruction execution breakpoints.
  • Break on frames after stop trigger.
  • Break on trace buffer full.
  • Execution timer, external break input.

Single-stepping

Single Step, Multiple Instruction Step, Step over Functions, Step into Functions, Step over Library-functions only, Return out of Functions at full speed

On-the-Fly Debugging
Full On-the-Fly, non-intrusive debugging: Set breakpoints, define triggers, view trace contents while your program is executing.

Variables
Full expression handling for assembler and C Variable monitoring, including complex arrays and structures

Host
PC with WindowsTM and standard RS232 Serial Port at 115Kbits/s.

Power Supply
Universal Power Supply, 100-240V, 50/60 Hz a.c.

Emulation Probe Adapters

Format Part Number Description
ISO7816
(ID-1)
 IN-CLA7816 Optional Probe Adapter for ISO7816 Smart Card contacts (ID-1 size). Emulates physical size and connections of ISO7816 Smart Card. Also contains a ZIF (Zero Insertion Force) SOIC28 socket, for testing of packaged engineering-samples of P8WE5000 ROM.

Ultra-P8WE5000 Device Support Range

P8WE50xx, P8WE60xx, MF2ICD8x.

Upgrade path
All Ultra systems can be easily field-upgraded to a different processor type, including P8RF5000, SmartMX and SmartXA2TM. See also our range of 32-bit development tools for the HiPerSmartTM family

Prototyping Kit
Optional Prototyping Kit (PKSC-P8WE5000) for Smart Card ROM prototyping (See DS211 PKSC-P8WE5000).
 

 
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